Author Affiliations
Abstract
1 The Key Laboratory of Optoelectronic Technology and System, Ministry of Education, Chongqing University, Chongqing 400044
2 Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900
The X-ray spectrum emitted from laser-produced plasma contains plentiful information. X-ray spectrometer is a powerful tool for plasma diagnosis and studying the information and evolution of the plasma. X-ray concave (elliptical) curved crystals analyzer was designed and manufactured to investigate the properties of laser-produced plasma. The experiment was carried out on Mianyang Xingguang-II Facility and aimed at investigating the characteristics of a high density iron plasma. Experimental results using KAP, LIF, PET, and MICA curved crystal analyzers are described, and the spectra of Au, Ti laser-produced plasma are shown. The focusing crystal analyzer clearly gave an increase in sensitivity over a flat crystal.
300.6560 spectroscopy X-ray 350.5400 plasmas 340.0340 X-ray optics Chinese Optics Letters
2004, 2(8): 08495
Author Affiliations
Abstract
1 Key Laboratory of Optoelectronic Technology and System, Chongqing University, Chongqing 400044
2 Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900
In order to measure spatially and temporarily resolved laser-produced plasma X-ray spectra in 0.2-2 nm region, a novel two-channel elliptically-bent crystal spectrograph has been developed. Dispersive elements are LiF, PET, Mica, and KAP crystals, which cover Bragg angles in the range of 30-67.5 degrees. Eccentricity and focal distance of twin ellipses are 0.9586 and 1350 mm, respectively. Spatially resolved spectrum is photographically recorded with an X-ray film or X-CCD camera in one channel, and temporarily resolved one is photographically recorded with an X-ray streak camera in another channel, thus spatially and temporarily resolved spectra can be simultaneously obtained. Spectral images were acquired with X-CCD and PET in SHENGUANG-II laser facility, and experimental results show that the spectral resolution of the spectrograph is about 0.002 nm.
120.6200 spectrometers and spectroscopic instrumentation 040.7480 X-rays 350.5400 plasmas Chinese Optics Letters
2004, 2(1): 0127